Nikon and JEOL join forces to introduce a powerful yet economic benchtop SEM.
As an entirely new advanced imaging tool for bioscience research and industrial inspection fields, the NeoScope benchtop SEM extends your vision by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM. Born from the combined expertise of Nikon Instruments and JEOL, the NeoScope SEM’s advanced features are complemented by simplicity and affordability.
Nikon Instruments Inc.
1300 Walt Whitman Road
Melville, NY 11747-3064,
+1-800-52-NIKON (within the U.S.A. only)
https://microscopy-news.com/wp-content/uploads/2017/01/3e057b629e52e0665bc6caa49e32273b.jpg453350otmarohttps://microscopy-news.com/wp-content/uploads/2017/01/Microscopy-news_logo_microscope_news.pngotmaro2017-01-11 08:57:162017-01-11 08:57:16Carl Zeiss: EVO® MA and LS Series SEM