EBSD Symposium and Workshop 2012 – 23-24 May 2012 – Wiesbaden, Germany

Date:23 – 24 May 2012
Venue: Parkhotel Schlangenbad, Schlangenbad/Wiesbaden, Germany
Organizer: Oxford Instruments

Oxford Instruments NanoAnalysis runs an EBSD Symposium every two years. This time the meeting will be held in Wiesbaden, Germany, and will cater for both experts and new users. What’s on?

Presentations by guest speakers

• “Analyses of thin-film solar cells by EBSD combined with other SEM and SPM techniques”
Dr. Daniel Abou-Ras, Helmholtz Zentrum, Berlin

• Topographic and Diffraction Contrast Imaging of Atomic Step Morphologies and Extended Defects by Forescattered Electron Imaging”
Prof. Yoosuf N. Picard, Carnegie Mellon University

Presentations by Oxford Instruments’ applications scientists
Dr. Singh Uhbi and others will present papers showing how EBSD can now achieve high resloution data even at low kV

Workshop sessions for experts and newcomers

• EBSD introduction and what can EBSD do for you
• Sample Preparation Techniques
• Basic Processing
• Advanced Processing
• 3D EBSD

A networking opportunity

• where you can meet users from within the EBSD community, share experiences and to learn more about the capabilities of this versatile technique
• meet the Oxford Instruments management team, product managers, application specialists…

Who should attend:

• Experts who want to learn more and network with others
• Anyone who has recently purchased or may be considering an EBSD system from Oxford Instruments
• Anyone who would like to meet the the Oxford Instruments EBSD team and hear of the latest developments

For more information and registration, or to express an interest in attending/presenting a paper, please visit
EBSD Symposium and Workshop 2012