Sunrise, Florida, May 16, 2011 – Sunrise Optical LLC: New Zebraoptical Low Coherence Fiber Optic Interferometer with Microscope Attachment has been developed for Micro Electromechanical Systems (MEMS) applications, and is available for sale as Zebraoptical Integrated Metrology Tool (ZIMT).
The Zebraoptical Integrated Metrology Tool employs standard Zebra Wafer Thickness and Wafer Topography Metrology (ZebraOptical CT-IR) coupled with optical microscope, and VIS/NIR spectrometer.
Zebraoptical Integrated Metrology Tool (ZIMT) allows user to measure substrate thickness, membrane thickness, coating thickness, and investigate optical properties of the coatings all on the same tool platform.
Please contact our sales department (sales@zebraoptical.com) for a more detailed application notes, and schedule tool demonstration.
Product Availability:
Sample measurement service is available now (please contact aplab@zebraoptical.com for details). Lead-time for the tool in the basic configuration is currently 1 to 3 weeks ARO.
About Sunrise Optical LLC
Sunrise Optical LLC is an optical metrology company located in Sunrise FL. It specializes in design and manufacturing of spectroscopic and imaging systems for three-dimensional image acquisition and development of new algorithms for three-dimensional image processing. Sunrise Optical LLC is serving the solar cell manufacturing and thin film metrology markets. More information on Sunrise Optical LLC can be found on the company website
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