ORNL and Asylum Research Organize Scanning Probe Microscopy Energy Applications Workshop
March 23, 2010 – The Center for Nanophase Materials Sciences at Oak Ridge National Laboratory (ORNL) and Asylum Research, the technology leader in scanning probe/atomic force microscopy (SPM/AFM), are co-organizing the International Workshop for Scanning Probe Microscopy for Energy Applications, to be held at ORNL September 15-17, 2010. This workshop of invited and contributed talks will cover the recent advances in characterization of energy-relevant materials systems using SPM/AFM techniques, as well as the state of the art in energy dissipation and transformation measurements by SPM/AFM. The three-day meeting will also include a poster session, as well as an equipment lab and hands-on tutorials for demonstration of recently developed dynamic and multi-spectral SPM/AFM modes on Asylum’s Cypher™ and MFP-3D™ SPM/AFMs. The keynote talk will be on “Local Probing of Carrier Dynamics in Polymer Photovoltaic Materials” by David Ginger of the University of Washington.
Detailed information on the agenda, presentations, and registration can be found at here.
Major topics to be covered include:
• Mapping of carrier dynamics and photoinduced behavior of photovoltaic materials
• Ionic and electronic transport in fuel cells and Li-ion batteries
• Energy harvesting by piezoelectric and ferroelectric systems,
• Novel advances in functional probes – microwave, thermal, and conductive
• Imaging energy transformations and dissipation by multimodal and Band Excitation SPM/AFM
“Energy generation, storage, and conversion systems are an integral component of emerging green technologies, including solar power, automotive, and storage components of solar and wind energy economics. The microscopic mechanisms underpinning solar cell, battery and fuel cell operations in the nanometer to micron range are currently not well understood. This workshop is designed to bring together leading scientists in these energy applications of SPM/AFM to share their research and spur additional work to advance the field, said Roger Proksch, President of Asylum Research.Added Sergei Kalinin of ORNL’s Center for Nanophase Materials Sciences, “Ultimately, our goal is to build a network of materials scientists centered on the applications of SPM for energy problems and to promote rapid dissemination of theoretical knowledge, experimental protocols, and novel technique development in this rapidly growing area. This workshop is a major first step toward our goals.”
About the Center for Nanophase Materials Sciences at Oak Ridge National Laboratory
The Center for Nanophase Materials Sciences at Oak Ridge National Laboratory is one of the five DOE Nanoscale Science Research Centers (NSRCs), premier national user facilities for interdisciplinary research at the nanoscale, supported by the DOE Office of Science. Together the NSRCs comprise a suite of complementary facilities that provide researchers with state-of-the-art capabilities to fabricate, process, characterize and model nanoscale materials, and constitute the largest infrastructure investment of the National Nanotechnology Initiative. The NSRCs are located at DOE’s Argonne, Brookhaven, Lawrence Berkeley, Oak Ridge, Sandia and Los Alamos National Laboratories. For more information about the DOE NSRCs, please visit www.nano.energy.gov
About Asylum Research
Asylum Research is the technology leader for scanning probe and atomic force microscopes (SPM/AFM) for both materials and bioscience applications. Founded in 1999, we are a company dedicated to innovative instrumentation for nanoscience and nanotechnology, with over 250 years combined AFM/SPM experience from our scientists, engineers and software developers. Our instruments are used for a variety of nanoscience applications in material science, physics, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more. Asylum’s product line offers imaging and measurement capabilities for a wide range of samples, including advanced techniques such as electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force microscopy (PFM), magnetic force microscopy (MFM) with our unique variable field module, quantitative nanoindenting, and a wide range of environmental accessories and application-ready modules.
Asylum’s MFP-3D™ set the standard for atomic force microscope technology, with unprecedented precision and flexibility. The MFP-3D is the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback sensor technology. The MFP-3D offers both top and bottom sample viewing for easy integration with most commercially-available inverted optical microscopes.
Asylum’s new Cypher™ AFM is the world’s first completely new small sample atomic force microscope in over a decade, and sets the new standard as the world’s highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate images and measurements possible today, rapid AC imaging with small cantilevers, Spot-On™ automated laser alignment for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major AFM/SPM scanning modes and capabilities.
Asylum Research offers the lowest cost of ownership of any atomic force microscope company. Ask us about our industry best 2-year warranty, our legendary product and applications support, and our exclusive 6-month money-back satisfaction guarantee. We are dedicated to providing the most technically advanced AFMs for researchers who want to take their experiments to the next level. Asylum Research also distributes third party cantilevers from Olympus, Nanoworld/Nanosensors, and our own MFM and iDrive™ tips.
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