New “Confocal Raman Microscopy” book edited by WITec Scientists
Febuary 2011 – The new “Springer Series in Optical Science” book on “Confocal Raman Microscopy” was edited by WITec Scientists Dr. Thomas Dieing, Dr. Olaf Hollricher and Dr. Jan Toporski and has just been released. The goal of the book is to provide the best possible overview of the theoretical and practical facts and issues associated with confocal Raman microscopy.
With the incorporation of over a dozen contributions from expert scientists and research groups spanning a wide range of applications in academic research as well as industry-driven research and development, this first edition of “Confocal Raman Microscopy” provides a comprehensive frame of reference for anyone involved in research employing confocal Raman microscopy.
Confocal Raman Microscopy (Springer Series in Optical Sciences)
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Since its founding in 1997, WITec has established itself as a market leaders in the field of nano-analytical microscope systems (Raman, AFM, SNOM). As reflected in WITec’s maxim “Focus Innovations”, our success is based on constantly introducing new technologies and a commitment to maintaining customer satisfaction through high-quality, flexible and innovative products.
A dedicated international market approach with an established service and support experience in the various regions of the world is one of our key strengths, evidenced by our widespread network of distributors and representatives as well as the US Sales and Service Office (WITec Instruments Corp. Maryville, TN).
The 33 employees worldwide have generated average annual growth rates of more than 10 % during the last few years.
WITec began with the introduction of the first Scanning Near-field Optical Microscope featuring easy to use cantilever SNOM sensors for reliable optical imaging beyond the diffraction limit. In addition, the Pulsed Force Mode accessory AFM module for imaging of local stiffness and adhesion along with topography was a successfully introduced to the AFM community.
With the release of the first Confocal Raman Imaging system in 1999, WITec outperformed the existing Raman mapping techniques in terms of sensitivity, speed and lateral resolution, pioneering Raman spectroscopy as a tool for true 3D chemical imaging.
The modular design of WITec microscopes allows the integration of Confocal Raman and Scanning Probe Microscopy in one system. This innovation instigated the current boom in combined Raman/SPM system.
As a result of this expertise, WITec recently received the R&D 100 Award for the first automated Raman AFM combination for large samples (alpha500).
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