The Nikon N-SIM Super Resolution Microscope has been judged one of the ten best microscopy innovations in the 2011 Microscopy Today Innovation Award competition.
August 15, 2011 – Announced at the Microscopy & Microanalysis exhibition in Nashville, Tennessee, USA, these are judged on innovations which move microscopy techniques forward in light microscopy, scanning probe microscopy, electron microscopy, analytical microscopy and specimen preparation, making imaging and analysis more powerful, more flexible, more productive and easier to accomplish.
Nikon N-SIM system
The competition is sponsored by Microscopy Today, a trade publication owned by the Microscopy Society of America and published by Cambridge University Press.
Source: Nikon Instruments Europe B.V.
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