Malvern Instruments scientist receives Ernst Abbe Memorial Award at 50th anniversary of the Eastern Analytical Symposium
22 November 2011; Malvern, UK: Dr E. Neil Lewis, Chief Technology Officer at Malvern Instruments can now count the prestigious Ernst Abbe Memorial Award of the New York Microscopical Society among his accolades. He received the award, presented in recognition of his outstanding contributions to the science of microscopy, on 17 November 2011 during the 50th Eastern Analytical Symposium & Exposition in New Jersey, and he joins a list of previous recipients who have made significant contributions to the field. Dr. Lewis is being recognized specifically for the development of chemical imaging microscopy.
The Ernst Abbe Memorial Awards session was chaired by Dr. John A. Reffner from John Jay College and Dr Lewis’s plenary lecture covered morphological and Raman spectroscopic measurements of complex heterogeneous materials.
Dr E Neil Lewis (right) Chief Technology Officer at Malvern Instruments receives the Ernst Abbe Memorial Award of the New York Microscopical Society from Dr. John A. Reffner (left) of John Jay College who chaired the Ernst Abbe Memorial Awards session on 17 November 2011 during the 50th Eastern Analytical Symposium & Exposition in New Jersey.
Prior to his award presentation, visitors to EAS 2011 had an initial opportunity on Tuesday afternoon to hear Dr Lewis discuss the physical and chemical heterogeneity of biopharmaceutical products using imaging, light scattering and vibrational spectroscopy. His colleague, Dr Linda Kidder from Malvern’s Analytical Imaging team, also spoke about ‘Combined Particle Analysis and Raman Spectroscopy of a Nasal Spray: Chemically-Confirmed API Particle Size Distribution’ on Wednesday morning.
Paul Walker, Managing Director of Malvern Instruments said: “To be marked out as having an influence on the development of a field as important as microscopy is a significant accomplishment, and it is a privilege at Malvern that we can count such exceptional scientists as Neil Lewis among our team. I am delighted to add my congratulations to him on this prestigious award.”
Neil Lewis received his PhD in Chemistry from the Polytechnic of Wales in the UK and did his postdoctoral fellowship at the National Institutes of Health (NIH) in the Laboratory of Chemical Physics in the USA. He was tenured by the NIH in 1992 and subsequently held the position of Senior Biophysical Researcher. In 1999 he left to lead a new effort in developing chemical imaging systems as a Founder and President of Spectral Dimensions, Inc (SDI); the company was acquired in July 2006 by Malvern Instruments.
Dr. Lewis is the author of more than 70 peer-reviewed scientific papers, patents and book chapters. He is the recipient of numerous awards which include the Meggers Award in 1992 and again in 1994, presented by the Society of Applied Spectroscopy; the Heinrich Award in 1995, presented by the Microbeam Analysis Society for Outstanding Young MAS Scientist; the Outstanding Contribution to the Physical Sciences Award in 1997, presented by the Washington Academy of Sciences and the 2004 Williams-Wright Award presented by the Coblentz Society. In 2007 he was honoured by the University of Glamorgan in Wales with the award of an Honorary Doctorate of Science for his contribution to science and innovation. In 2009 he received the Anachem Award from the Association of Analytical Chemists which recognises an outstanding analytical chemist who has advanced the art and science of the field. He is a Fellow of the Society of Applied Spectroscopy and a Fellow of the Royal Society of Chemistry
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About Malvern Instruments
Malvern Instruments is a market leader in measuring performance controlling material properties. These include particle size, particle shape, zeta potential, molecular weight, size and conformation, rheological properties and chemical identification. Malvern delivers the systems, support and expertise that ensure the analytical integrity and productivity needed to drive research, development and manufacturing.
Malvern’s measurement solutions for scientists, technologists and engineers advance continually through customer collaboration. Complementary materials characterization systems deliver inter-related measurements that reflect the complexities of particulates and disperse systems, nanomaterials and macromolecules. Combining intelligently implemented technologies with in-depth industry applications knowledge and support, Malvern provides customers with the competitive advantage they demand.
Headquartered in Malvern, UK, Malvern Instruments has subsidiary organizations in all major European markets, North America, China, Japan and Korea, a joint venture in India, a global distributor network and applications laboratories around the world.
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