Lehigh Microscopy School 2012 Program and Registration Materials are now available online

November 24, 2012.
The 2012 Program and Registration Materials for Lehigh Microscopy School are now available online or download a brochure here.

Lehigh Microscopy School – 42 Years of Excellence

Lehigh’s SEM courses were founded by Joe Goldstein in 1970. More than three decades later, the Lehigh Microscopy School is widely recognized as the largest and best in the world.

Over 5,500 engineers, scientists, and technicians have taken our courses, coming from 50 states and 35 countries. Goldstein et al., the SEM textbook, has worldwide sales of over 50,000 copies since its first publication in 1975. Fifteen of our lecturers have served as president of one of the major microscopy, microanalysis, or materials societies. Lecturers have more than 850 years of combined experience in microscopy and microanalysis at the world’s leading research institutions and universities.

Courses offered June 3-15, 2012:

MAIN COURSE:
• Scanning Electron Microscopy and X-ray Microanalysis
• Introduction to SEM and EDS for the New SEM Operator

SPECIALIZED COURSES:
• Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques
• Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications
• Focused Ion Beam (FIB)
• Instrumentation and Applications

Complete course descriptions and registration form can be found at www.lehigh.edu/microscopy

Contact
Sharon Coe
Lehigh Microscopy School
5 East Packer Avenue
Bethlehem, PA 18015
Phone: 610-758-5133
Fax: 610-758-4244
e-mail: slc6@lehigh.edu

www.lehigh.edu/microscopy