FEI Wins Multi-System Order From CANMET Materials Technology Laboratory
Federally-Funded Research Center Selects the Tecnai Osiris TEM, Helios NanoLab DualBeam and Nova NanoSEM as Part of a Competitive Evaluation
HILLSBORO, Ore., Jan. 5, 2011 (GLOBE NEWSWIRE) — FEI Company (Nasdaq:FEIC), a leading instrumentation company providing electron microscope systems for applications in research and industry, today announced that the CANMET Materials Technology Laboratory (CANMET-MTL), a research center funded by the Canadian government, has selected three of FEI’s latest electron microscope systems for its new facility at the McMaster Innovation Park, Hamilton, Ontario. As part of a competitive evaluation, CANMET-MTL has purchased the Tecnai Osiris™ scanning/transmission electron microscope (S/TEM), the Helios NanoLab™ DualBeam™, and the Nova™ NanoSEM ultra-high resolution scanning electron microscope (SEM).
According to Tony Edwards, senior vice president for FEI market divisions, “The FEI systems were selected due to a combination of technical capability, price and superior service. CANMET-MTL will have some of the newest, most advanced electron microscopes in its facility.”
The Tecnai Osiris S/TEM combines breakthrough analytical throughput with exceptional ease-of-use for high-volume, multi-user research facilities. It features FEI’s ChemiSTEM™ technology, which reduces the time for large field-of-view elemental mapping from hours to minutes.
The Helios NanoLab DualBeam, the most powerful and versatile DualBeam available today, integrates FEI’s extreme high-resolution scanning electron microscope (XHR SEM) with a new, high-performance focused ion beam (FIB), to deliver an unprecedented level of imaging and milling capability. It is designed for research centers that need to perform advanced material characterization and modification down to the single nanometer scale.
FEI’s Nova NanoSEM is an ultra-high resolution SEM designed to provide industry-leading nanometer-scale resolution and ultra-precise analysis on the widest range of samples. Adding to this versatility, the system can examine highly insulating samples in low vacuum, with up to nearly the same resolution that can be achieved in high vacuum and with little or no preparation, eliminating artifacts and saving time.
The systems will be shipped to CANMET-MTL in Q1 2011. For more information, please visit www.fei.com
FEI (Nasdaq:FEIC) is a leading diversified scientific instruments company. It is a premier provider of electron- and ion-beam microscopes and tools for nanoscale applications across many industries: industrial and academic materials research, life sciences, semiconductors, data storage, natural resources and more. With more than 60 years of technological innovation and leadership, FEI has set the performance standard in transmission electron microscopes (TEM), scanning electron microscopes (SEM) and DualBeams™, which combine a SEM with a focused ion beam (FIB). FEI’s imaging systems provide 3D characterization, analysis and modification/prototyping with resolutions down to the sub-Angstrom (one-tenth of a nanometer) level. FEI’s NanoPorts in North America, Europe and Asia provide centers of technical excellence where its world-class community of customers and specialists collaborate. FEI has approximately 1800 employees and sales and service operations in more than 50 countries around the world. More information can be found at:
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