Catalog: Planar Piezo Scanners for AFM, Scanning Probe Microscopes

March 10, 2011 – PI (Physik Instrumente) L.P. — a leading manufacturer of piezo nanopositioning systems and scanners for microscopy, bio-medical and nanotechnology applications — has released a new catalog on planar piezo scanners for Atomic Force and Scanning Probe microscopy.

The new catalog covers a variety of novel closed-loop planar piezo scanners, and controllers with advanced digital features for higher scanning rates, improved linearity and responsiveness.

Compared to conventional piezo tube scanners, the low-bow, flexure guided piezo stages are run in closed-loop mode and provide significantly lower out of plane motion (flatness) and better linearity. A special stage designed with a new lead-free piezo material allows resolution down to 20 picometers and less than 1 nanometer hysteresis.

Flexure stages with travel ranges to 1800 microns are available and many different configurations from single axis to 6-axis systems are offered.

Self-locking ultrasonic motor stages with long travel ranges to 200mm are also available for pre-positioning, and as a stable base for the high-speed piezo scanners.

The Piezo Scanner Catalog can be downloaded at: www.piezo.ws/pdf/Catalog_AFM_Planar_Piezo_Stage_Scanner_C.pdf

About PI
PI is a leading manufacturer of piezo systems, nanopositioning controllers, hexapod systems, piezo stages, piezo linear motors and precision motion-control equipment for photonics, bio-nanotechnology & semiconductor applications. PI has been developing and manufacturing standard & custom precision products with piezoceramic and electromagnetic drives for 35+ years. The company has been ISO 9001 certified since 1994 and provides innovative, high-quality solutions for OEM and research. PI is present worldwide with eight subsidiaries and total staff of 500+

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