The DSX500 upright opto-digital microscope for combining darkfield, brightfield and 3D imaging
Hamburg, May 2012 – As part of the newly launched portfolio of DSX opto-digital microscopes, the DSX500 high resolution upright inspection system offers advanced analysis, while being simple for every user to use, regardless of their expertise. With its motorised control, the DSX500 allows the simple selection of the best observation method, including differential interference contrast and MIX – a combination of darkfield and brightfield techniques. The intuitive touch screen user interface not only eliminates the need for uncomfortable binoculars, but enables the selection of the best observation method. With the ability to automatically focus and optimise illumination, clear images are obtained easily. Users can choose the panoramic function which enables operators to obtain images beyond the field of view in high definition – whether in 2D or 3D. Simply at the touch of a screen users can obtain exact inspection data, and subsequent resulting reports.
The DSX500 puts a wide range of illumination options into the hands of every user, regardless of their levels of expertise. With the DSX500, users can simply select brightfield, darkfield, differential interference contrast (DIC), polarised observation (PO) or MIX function, by touching the automatically generated on-screen preview images. The new MIX function essentially combines brightfield measurements with darkfield LED illumination, providing a totally novel way of detecting defects and imperfections while observing the sample, opening a range of new application opportunities. In combination with the high dynamic range (HDR) and WiDER functionality, which reduces contrast and increases clarity, users can easily obtain high-fidelity images with no halation or blackouts.
Building on the capabilities of the DSX100, the DSX500 incorporates a 13x zoom range. World leading optics provide excellent contrast, which can be used to perform reliable 3D analysis. The use of the specially designed long-working distance lenses also allow in-depth inspection and measurement of samples with uneven surfaces, without any worry of damage (either to the microscope or the sample) since the lens and sample are less likely to come into contact.
The DSX500 opto-digital microscope incorporates all of the user friendly features common to the DSX portfolio. As a computer-based system, it is driven by a user friendly graphical user interface with touch-screen functionality. The ‘best image’ function ensures that the optimal image is captured every time, while the three operator modes ensure that the relevant functionality and guidance is tailored to the experience level of the operator.
Integrating Olympus’s leading CCD camera, dedicated objective lenses, intuitive interface and a wide range of imaging and illumination options, the DSX500 provides the complete analysis and inspection system for any application.
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